Predict and Prevent High-Power RF Failures

Spark3D – 3D RF Breakdown Simulation for Safe and Reliable Designs



Overview

Spark3D is a dedicated simulation tool for predicting RF breakdown power levels in high-power microwave and RF components. It accurately models both multipactor discharge (in vacuum) and gas discharge/corona (in gaseous environments), helping engineers identify the safe operating power of devices such as waveguides, cavities, and antennas.

The tool imports electromagnetic field data from solvers like CST Studio Suite and performs detailed 3D analyses of breakdown effects. With advanced electron-tracking and plasma modeling, it determines realistic breakdown thresholds to prevent failures and avoid costly over-design. Widely used in satellite, radar, aerospace, and communication systems, Spark3D ensures high reliability in demanding high-power RF environments.

Features

Analyze high-field EM phenomena with integrated solvers and multipactor/corona discharge prediction.

Integrated EM Solver Workflow

Import field data from CST Studio Suite or other full-wave solvers for seamless analysis.

Breakdown Threshold Prediction

Automatically calculates multipactor (vacuum) and corona/gas discharge limits.

Focused High-Field Analysis

Define simulation regions to concentrate on high-field intensity zones.

3D Multipactor & Electron Tracking

Includes secondary electron emission (SEY) modeling and multi-carrier signal support.

Visualization & Analysis Tools

Rich 3D plots, tables, and trajectory maps for electron behavior and discharge analysis.

Applications

Ensure high-field EM reliability across devices, satellite systems, and defense applications.

High-Power RF & Microwave Devices

Assess waveguides, cavities, filters, couplers, and antennas for breakdown risks.

Satellite & Space Systems

Determine safe power thresholds under vacuum or gas conditions to prevent discharge.

Defense, Radar & Particle Accelerators

Ensure reliability in high-field-intensity environments.

Early-Stage Design Screening

Predict realistic breakdown limits to reduce over-design and testing risks.

Optimized Device Validation

Identify weak high-field regions and optimize components before fabrication or high-power testing.